The combination of silicon wafers and thermal oxide allows for many more things than just heat transfer. These include better conductivity, higher bandwidth, and even better insulation. However, the biggest thing that thermal oxide can offer is a structural change in objects, making the material stronger and more durable. The oxide is able to change the electronic charges on any surface, changing its charge structure in the process. This results in greater strength and less susceptibility to indentation and bending. This makes the material better suited to use in things like mechanical seals, where the properties are best served by a change to a new material.
Please send us your specs for an immediat quote!
A distinguished professor of a physics and astronomy department asks what is the difference between dry oxide and thermal oxide? I just want make sure SiOx layer could be used as the gate dielectric for our field effect transistors.
Both "dry oxide" and "thermal oxide" refer to silicon dioxide (SiO2) layers that are grown on silicon wafers, primarily used in semiconductor device fabrication. The difference between the two lies in the method of growth and the properties of the oxide:
Method of Growth:
Dry Oxidation: In this method, silicon wafers are exposed to dry oxygen (O2) at high temperatures to form silicon dioxide. The reaction can be simplified as: Si+2H20→SiO2
Thermal Oxidation: The term "thermal oxidation" is a broader category that includes both dry and wet oxidation processes. In wet oxidation, silicon wafers are exposed to water vapor (H₂O) at high temperatures. The reaction can be simplified as:Si+2H2O→SiO2+2H2
Wet oxidation typically grows oxide faster than dry oxidation and results in a slightly different oxide quality.
Properties:
Applications:
To summarize, while both dry and thermal oxides are grown through high-temperature processes on silicon, the distinction primarily lies in the oxidizing agent (O₂ vs. H₂O) and the resulting properties of the oxide. It's worth noting that "thermal oxide" as a term can technically encompass both dry and wet oxides, but when comparing the two, it's often referring to the wet oxidation process.
Thickness range: 500Å – 15µm
Thickness tolerance: Target +/-5%
Within wafer uniformity: +/-3% or better
Wafer to wafer uniformity: >+/-5% or better
Sides processed: Both
Refractive index: 1.456
Film stress: -320MPa (Compressive)
Wafer size: 50mm, 100mm, 125mm, 150mm, 200mm
Wafer thickness: 100µm – 2,000µm
Wafer material: Silicon, Silicon on Insulator, Quartz
Temperature: 950C° – 1050C°
Gases: Steam
Equipment: Horizontal Furnace
Our Ultra-Pure Wet Thermal Oxidation process is designed to insure that you receive the highest quality films. Prior to thermal oxidation
all wafers will receive a pre-furnace clean.
Our ultra-pure Dry Oxidation process is available for those applications requireing thinner oxides, and is designed to ensure that you
receive the highest quality film.
Our Dry Chlorinated Thermal Oxidation is recommended for use in MOS and other active device fabrication processes. Using Dry Cholorinated Thermal Oxide can help your devices to perform to its highest potential by eliminating metal ions.
Thermal Oxide Calculator
50.8mm P/B (100)1-10 ohm-cm 280um SSP $ each
With 300nm of Oxide $ each
with 100nm of LPCVD Nitride $ each
100mm N/Ph (100) 1-10 ohm-cm 500um SSP $12.90 each
with 300nm of oxide $ each
with 100nm of LPCVD Nitride $ each
100mm N/As (100) 0.001-0.005 ohm-cm 500um SSP $ each
with 300nm of oxide $ each
with 100nm of LPCVD Nitride $ each
100mm P/B (100) 1-10 ohm-cm 500um SSP $ each
with 300nm of oxide $ each
with 100nm of LPCVD Nitride $ each
100mm P/B (100) 0.001-0.005 ohm-cm 500um SSP $13.90 each
with 300nm of oxide $ each
with 100nm of LPCVD Nitride $ each
100mm P/B (100) 1-20 ohm-cm 1,00um SSP $15.90 each
with 300nm of oxide $ each
with 100nm of LPCVD Nitride $ each
100mm P/B (100) 0.01-0.02 ohm-cm 525um SSP $13.90 each
with 300nm of oxide $ each
with 100nm of LPCVD Nitride $ each